Atomic Force Microscopy

Asylum Research is the technology leader in Atomic Force Microscopy (AFM). All Asylum Research AFMs feature exceptional performance and versatility and include the industry’s best customer support, reliability, and warranties. Finding the best atomic force microscope for your work is important. There are many choices and not all AFMs are created equal. The right choice will make you more productive and move your research forward. You can count on AFMs from Asylum Research, no matter what your application or your budget. Discover why leading labs around the world choose Asylum Research.

Asylum Research AFMs are widely used in applications including:

  • Polymer and Materials Science
  • Piezoelectrics and Ferroelectrics
  • Thin Films and Coatings
  • Magnetics and Data Storage
  • Photovoltaics / Solar / Energy Storage / Electrochemistry
  • Microelectronics and Nanoelectronics
  • Life Science and Biophysics
  • Cell Biology / Cell Mechanics / Mechanobiology
  • Molecular Biology and Structural Biology
  • Single Molecule Force Spectroscopy / Protein Unfolding

Discover the full range of capabilities that Asylum Research AFMs can provide:

  • Measure high resolution topography- from single atomic points defects up to 90µm scans
  • Measure nanomechanical properties- storage and loss modulus
  • Measure thermal properties- temperature and thermal transitions
  • Measure electrical properties- Current, Resistance / Conductivity, Capacitance / Permittivity
  • Measure piezoelectric response and properties
  • Operate in gases and liquids, sealed or with perfusion
  • Operate at controlled humidity from sub-ppm glovebox conditions to >98%RH
  • Control sample temperature from -30 to 400°C
  • Apply electric fields up to 220V
  • Apply magnetic fields up to 0.8 Tesla
  • Apply mechanical strain up to 80 Newtons

Asylum Research AFMs feature a wide range of standard and optional modes:

  • Contact Mode
  • Lateral Force Mode (LFM)
  • AC Mode (Tapping Mode)
  • Phase Imaging
  • Dual AC™
  • MicroAngelo (nanolithography / nanomanipulation)
  • Electric Force Microscopy (EFM)
  • Kelvin Probe Force Microscopy (KPFM)
  • Magnetic Force Microscopy (MFM)
  • Piezoresponse Force Microscopy (PFM)
  • Vector PFM
  • Switching Spectroscopy PFM
  • Dual AC Resonance Tracking (DART)
  • AC Mode with Q-control
  • Force Curve Mode
  • Force Mapping Mode (Force Volume)
  • Loss Tangent Imaging
  • Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
  • AM-FM Viscoelastic Mapping
  • Contact Resonance Viscoelastic Mapping
  • iDrive™ (magnetically actuated AC Mode in fluid)
  • Scanning Tunneling Microscopy (STM)
  • Force Modulation
  • Scanning Thermal Microscopy (SThM)
  • Band Excitation

Our Concept is to provide high-quality industry-specific design services even under the tightest budgets, deadlines, and we continually invest not only in new technologies, but also in our creative talent..

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