The NANO-MASTER is an innovative µ-XRF benchtop analyser for the measurement of the latest generation of very small electronic components and thin coatings using standardless analysis down to the nanometre scale.

The NANO-MASTER has the lowest limits of detection and allows component compliance testing to  RoHS, WEEE, ELV specifications.


  • High resolution Peltier cooled Si-PIN detector for simple element identification
  • HiSpex digital pulse processing for the greatest X-ray flux and minimal analysis time
  • X-ray beam down to <25 µm for the smallest spot analysis
  • Vacuum measuring chamber for an extended element range from 13Al to 92U

Our Concept is to provide high-quality industry-specific design services even under the tightest budgets, deadlines, and we continually invest not only in new technologies, but also in our creative talent..

Latest Reference List

Thank you for visiting EGS, Find us on these social networks and view recent activity below.

YouTube Logo

Check out our LinkedIn for more information !


Do you want to catch up with the latest news, all delivered to your inbox? To sign up, simply add your email below.

No spam, we promise. For more info,. ContactUs .