NANO-MASTER

The NANO-MASTER is an innovative µ-XRF benchtop analyser for the measurement of the latest generation of very small electronic components and thin coatings using standardless analysis down to the nanometre scale.

The NANO-MASTER has the lowest limits of detection and allows component compliance testing to  RoHS, WEEE, ELV specifications.

Highlighs

  • High resolution Peltier cooled Si-PIN detector for simple element identification
  • HiSpex digital pulse processing for the greatest X-ray flux and minimal analysis time
  • X-ray beam down to <25 µm for the smallest spot analysis
  • Vacuum measuring chamber for an extended element range from 13Al to 92U

Our Concept is to provide high-quality industry-specific design services even under the tightest budgets, deadlines, and we continually invest not only in new technologies, but also in our creative talent..


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